O-Doped Sb70Se30 Phase-Change Materials for High Thermal Stability and Fast Speed

摘要：

In situ temperature-dependent resistance (R–T)measurement was applied to investigate the amorphous-to-crystalline transition by using a TP 94temperature controller (Linkam Scientific Instruments, Tadworth, Surrey, UK) under Ar atmosphere. The diffuse reflectivity spectra of the filmswere recorded by the NIR spectrophotometer(7100CRT; Xinmao, China). The phase structuresof the films annealed at various temperatures wereinvestigated by x-ray diffraction (XRD). The diffraction patterns were taken in the 2h range from 20 to60 using Cu Ka radiation with a scanning step of0.01/min. Picosecond laser technology was performed to measure the reflectivity change in realtime during the phase transition process, using apicosecond frequency-doubled model-locked neodymium yttrium aluminum garnet laser operating at532 nm wavelength with a pulse duration of 30 ps.The surface morphology of the films was observedby atomic force microscopy (AFM; FM-Nanoview1000), which was carried out in the semi-contactmode.

 
作者：

YUEMEI SUN,YIFENG HU,XIAOQIN ZHU,HUA ZOU,YONGXING SUI, JIANZHONG XUE, LI YUAN,JIANHAO ZHANG,LONG ZHENG,DAN ZHANG and ZHITANG SONG

期刊：